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Source ID: 2000115074
Brief Citation: Sham, et al. X-Ray Excited Optical Luminescence, Thin Solid Films (2000)
Full Citation: Sham, T.K., et al. “X-Ray Excited Optical Luminescence (XEOL): A Potential Tool for OELD Studies.” Thin Solid Films, vol. 363, no. 1-2, Mar. 2000, pp. 318–321, 10.1016/s0040-6090(99)01006-8. Accessed 9 Feb. 2022.
 
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