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secondary ion mass spectrometry (mass spectrometry, analysis and testing techniques, ... Processes and Techniques (hierarchy name)) |
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Note: A form of mass spectrometry commonly used for surface analysis. When a primary beam of accelerated ions strikes a solid surface, secondary ions are among the elements displaced in a process called sputtering. These ions may be directly studied to gain information about the target material. |
Terms: |
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secondary ion mass spectrometry (preferred,C,U,English-P,D,U,U)
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secondary ion mass spectrometry (Dutch-P,D,U,U)
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spectrometry, secondary ion mass (C,U,English,UF,U,U)
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SIMS (C,U,A,English,UF,U,U)
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Facet/Hierarchy Code: K.KT |
Hierarchical Position:
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![Hierarchy of Activities Facet](/global/images/global_hierarchy.gif)
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Activities Facet |
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![Hierarchy of Processes and Techniques (hierarchy name)](/global/images/global_hierarchy.gif)
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.... Processes and Techniques (hierarchy name) (G) |
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![Hierarchy of <processes and techniques by specific type>](/global/images/global_hierarchy.gif)
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........ <processes and techniques by specific type> (G) |
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![Hierarchy of analysis and testing techniques](/global/images/global_hierarchy.gif)
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............ analysis and testing techniques (G) |
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![Hierarchy of mass spectrometry](/global/images/global_hierarchy.gif)
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................ mass spectrometry (G) |
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![Hierarchy of secondary ion mass spectrometry](/global/images/global_hierarchy.gif)
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.................... secondary ion mass spectrometry (G) |
Additional Notes: |
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Dutch ..... Een vorm van massaspectrometrie die veel gebruikt wordt voor oppervlakteanalyse. Als een primaire straal van versnelde ionen een vast oppervlak raakt, komen bepaalde deeltjes, waaronder secundaire ionen, vrij in een proces dat 'sputtering' genoemd wordt. Deze ionen kunnen direct onderzocht worden om informatie over het doelmateriaal op te doen. |
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