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scanning electron microscopes (electron microscopes, microscopes, ... Furnishings and Equipment (hierarchy name)) |
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Note: Electron microscopes designed for directly studying the surfaces of solid objects, utilizing a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen. An electrical signal is obtained by collecting and amplifying secondary electrons emitted by the specimen and is applied to a cathode-ray tube scanned in synchronism with the electron beam.
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| Terms: |
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| scanning electron microscopes (preferred,C,U,English-P,D,U,PN)
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| scanning electron microscope (C,U,English,AD,U,SN)
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| microscope, scanning electron (C,U,English,UF,U,U)
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| 掃描電子顯微鏡 (C,U,Chinese (traditional)-P,D,U,U)
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| SEM (C,U,Chinese (traditional),UF,U,U)
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| 掃描式電子顯微鏡 (C,U,Chinese (traditional),UF,U,U)
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| 掃描電鏡 (C,U,Chinese (traditional),UF,U,U)
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| 掃描式電鏡 (C,U,Chinese (traditional),UF,U,U)
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| 電子掃描顯微鏡 (C,U,Chinese (traditional),UF,U,U)
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| sǎo miáo diàn zǐ xiǎn wéi jìng (C,U,Chinese (transliterated Hanyu Pinyin)-P,UF,U,U)
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| sao miao dian zi xian wei jing (C,U,Chinese (transliterated Pinyin without tones)-P,UF,U,U)
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| sao miao tien tzu hsien wei ching (C,U,Chinese (transliterated Wade-Giles)-P,UF,U,U)
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| rasterelektronenmicroscopen (C,U,Dutch-P,D,U,U)
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| rasterelektronenmicroscoop (C,U,Dutch,AD,U,U)
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| microscope électronique à balayage (C,U,French-P,AD,U,MSN)
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| Rastermikroskope (C,U,German,D,SN)
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| Rasterelektronenmikroskop (C,U,German-P,AD,SN)
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| Rasterelektronenmikroskope (C,U,German,UF,PN)
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| Rastermikroskop (C,U,German,UF,SN)
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Facet/Hierarchy Code: V.TH |
Hierarchical Position:
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Objects Facet |
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.... Furnishings and Equipment (hierarchy name) (G) |
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........ Tools and Equipment (hierarchy name) (G) |
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............ equipment (G) |
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................ <equipment by profession or discipline> (G) |
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.................... <equipment for science and technology> (G) |
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........................ optical instruments (G) |
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............................ microscopes (G) |
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................................ electron microscopes (G) |
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.................................... scanning electron microscopes (G) |
Additional Notes: |
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| Chinese (traditional) ..... 設計用於直接研究固態物體表面的電子顯微鏡，用能量較低的聚焦電子束作為電子探針，以規律的方式對標本進行掃描。電子信號的取得是透過收集和增強標本所散發之次要電子，並導入以電子束同時掃瞄的陰極射線管內。 |
| Dutch ..... Elektronische microscopen waarmee men het oppervlak van vaste objecten direct kan bestuderen. Hiertoe gebruikt men een geconcentreerde elektronenbundel met een relatief lage energie die op reguliere wijze over het voorwerp scant. Door de secundaire elektronen die van het object afkomen te verzamelen en te versterken, genereert men een elektrisch signaal. Dat signaal leidt men vervolgens door een kathodestraalbuis die synchroon met de elektronenstraal wordt gescand. |
| German ..... Elektronenmikroskop, das für die direkte Untersuchung der Oberflächen fester Körper entwickelt wurde: Hierbei dient ein gebündelter Elektronenstrahl von geringer Energie als eine Elektronensonde, welche das Untersuchungsobjekt abschnittsweise abscannt. Dabei ergibt sich ein elektrisches Signal, indem die von der Probe abgesonderten sekundären Elektronen gesammelt und verstärkt und auf eine Kathodenstrahlröhre bezogen werden, die gleichzeitig mit dem Elektronenstrahl gescannt wird. |
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Related concepts: |
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| required for .... |
scanning electron microscopy |
| ...................... |
(electron microscopy, microscopy, ... Processes and Techniques (hierarchy name)) [300224957] |
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Sources and Contributors: |
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